Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging Analysis
Nobuo Tanaka
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.
Readership: Graduate students and researchers in the field of nanomaterials and nanostructures.
Categorie:
Anno:
2014
Casa editrice:
Imperial College Press
Lingua:
english
Pagine:
400
ISBN 10:
184816789X
ISBN 13:
9781848167896
File:
PDF, 34.73 MB
IPFS:
,
english, 2014
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